Geometric perspective on quantum parameter estimation

Jasminder S. Sidhu, Pieter Kok

Research output: Contribution to journalReview article

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Abstract

Quantum metrology holds the promise of an early practical application of quantum technologies, in which measurements of physical quantities can be made with much greater precision than what is achievable with classical technologies. In this Review, the authors collect some of the key theoretical results in quantum parameter estimation by presenting the theory for the quantum estimation of a single parameter, multiple parameters, and optical estimation using Gaussian states. The authors give an overview of results in areas of current research interest, such as Bayesian quantum estimation, noisy quantum metrology, and distributed quantum sensing. The authors address the question of how minimum measurement errors can be achieved using entanglement as well as more general quantum states. This review is presented from a geometric perspective. This has the advantage that it unifies a wide variety of estimation procedures and strategies, thus providing a more intuitive big picture of quantum parameter estimation.
Original languageEnglish
Article number014701
Number of pages35
JournalAVS Quantum Science
Volume2
Issue number1
Early online date11 Feb 2020
DOIs
Publication statusE-pub ahead of print - 11 Feb 2020

Keywords

  • quantum technologies
  • quantum parameter estimation
  • Gaussian states

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