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Frontiers in atomic-level manufacturing: atomic-scale electrochemical deposition

Zubair Akbar, Haibin Liu, Nan Zhang, Pingmei Ming, Honggang Zhang*, Xichun Luo

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

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Abstract

Atomic-level manufacturing, as the “keystone” of future technology, marks the transformative shift from the micro/nano era based on “classical theory” to the atomic era grounded in “quantum theory”. It enables the precise control of matter arrangement and composition at the atomic scale, thereby achieving large-scale production of atomically precise and structured products. Electrochemical deposition (ECD), a typical “atom addition” fabrication method for electrochemical atomic and close-to-atomic scale manufacturing (EC-ACSM), enables precise control over material properties at the atomic scale, allowing breakthroughs in revolutionary performance of semiconductors, quantum computing, new materials, nanomedicine, etc. This review explores the fundamentals of EC-ACSM, particularly at the electrode/electrolyte interface, and investigates maskless ECD techniques, highlighting their advantages, limitations, and the role of in situ monitoring and advanced simulations in the process optimization. However, atomic electrochemical deposition faces significant challenges in precise control over atom-ion interactions, electrode-electrolyte interfacial dynamics, and surface defects. In the future, overcoming these obstacles is critical to advancing EC-ACSM and unlocking its full potential in scalability for industrial applications. EC-ACSM can drive the highly customized design of materials and offer strong technological support for the development of future science, ushering in a new atomic era of material innovation and device manufacturing..

Original languageEnglish
Article number062008
Number of pages66
JournalInternational Journal of Extreme Manufacturing
Volume7
Issue number6
Early online date28 Aug 2025
DOIs
Publication statusPublished - 1 Dec 2025

Funding

The authors gratefully acknowledge the support from the National Natural Science Foundation of China (Grant Nos. 52405447 and 52275299), the National Key Research and Development Program of China (Grant No. 2021YFB1716200), the Key Research and Development Program of Jiangxi Province in China (Grant No. 20232BBE50011).

Keywords

  • atomic-scale electrochemical deposition
  • atomic-level manufacturing
  • in situ electrochemistry
  • quantum manufacturing

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