Fluorescence lifetime estimation method for incomplete decay

Hongqi Yu, David Day-Uei Li

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A new incomplete decay signal model is proposed to describe the
incomplete decay effects in a time-correlated single-photon counting
(TCSPC) based fluorescence lifetime imaging (FLIM) system. Based on
this model, we modified a MUltiple SIgnal Classification (MUSIC)
algorithm to eliminate the incomplete decay effects. Monte Carlo
simulations were carried out to demonstrate the performances of the
proposed approach. Simulations show that the proposed method is
insensitive to the laser pulse rate and has a larger lifetime dynamic range
compared with previously reported approaches. As far as we know, this
new method is the first non-fitting method that can resolve incomplete
decay effects for multi-exponential decays.
LanguageEnglish
Number of pages2
JournalElectronics Letters
Early online date25 Sep 2015
DOIs
Publication statusPublished - 25 Sep 2015

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Fluorescence
Imaging systems
Laser pulses
Photons
Optical Imaging
Lasers
Heart Rate

Keywords

  • decay signal model
  • decay effects
  • fluorescence lifetime imaging

Cite this

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title = "Fluorescence lifetime estimation method for incomplete decay",
abstract = "A new incomplete decay signal model is proposed to describe theincomplete decay effects in a time-correlated single-photon counting(TCSPC) based fluorescence lifetime imaging (FLIM) system. Based onthis model, we modified a MUltiple SIgnal Classification (MUSIC)algorithm to eliminate the incomplete decay effects. Monte Carlosimulations were carried out to demonstrate the performances of theproposed approach. Simulations show that the proposed method isinsensitive to the laser pulse rate and has a larger lifetime dynamic rangecompared with previously reported approaches. As far as we know, thisnew method is the first non-fitting method that can resolve incompletedecay effects for multi-exponential decays.",
keywords = "decay signal model, decay effects, fluorescence lifetime imaging",
author = "Hongqi Yu and Li, {David Day-Uei}",
year = "2015",
month = "9",
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language = "English",
journal = "Electronics Letters",
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Fluorescence lifetime estimation method for incomplete decay. / Yu, Hongqi; Li, David Day-Uei.

In: Electronics Letters, 25.09.2015.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Fluorescence lifetime estimation method for incomplete decay

AU - Yu, Hongqi

AU - Li, David Day-Uei

PY - 2015/9/25

Y1 - 2015/9/25

N2 - A new incomplete decay signal model is proposed to describe theincomplete decay effects in a time-correlated single-photon counting(TCSPC) based fluorescence lifetime imaging (FLIM) system. Based onthis model, we modified a MUltiple SIgnal Classification (MUSIC)algorithm to eliminate the incomplete decay effects. Monte Carlosimulations were carried out to demonstrate the performances of theproposed approach. Simulations show that the proposed method isinsensitive to the laser pulse rate and has a larger lifetime dynamic rangecompared with previously reported approaches. As far as we know, thisnew method is the first non-fitting method that can resolve incompletedecay effects for multi-exponential decays.

AB - A new incomplete decay signal model is proposed to describe theincomplete decay effects in a time-correlated single-photon counting(TCSPC) based fluorescence lifetime imaging (FLIM) system. Based onthis model, we modified a MUltiple SIgnal Classification (MUSIC)algorithm to eliminate the incomplete decay effects. Monte Carlosimulations were carried out to demonstrate the performances of theproposed approach. Simulations show that the proposed method isinsensitive to the laser pulse rate and has a larger lifetime dynamic rangecompared with previously reported approaches. As far as we know, thisnew method is the first non-fitting method that can resolve incompletedecay effects for multi-exponential decays.

KW - decay signal model

KW - decay effects

KW - fluorescence lifetime imaging

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DO - 10.1049/el.2015.2015

M3 - Article

JO - Electronics Letters

T2 - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

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