Abstract
Ultrashort pulse laser ablation of gallium nitride (GaN) has been studied. Utilizing a 1 kHz femtosecond Ti:sapphire laser with a peak intensity of approximately 10(16) W cm(-2), we have successfully demonstrated controlled ablation of metal organic chemical vapour deposition and hydride vapour phase epitaxy grown GaN. Groove patterns 10-100 mum wide and as deep as 30 mum have been produced both in air and in a vacuum chamber and analyzed by scanning electron microscope and stylus profiling. This approach is demonstrated to be highly suitable for micromachining and controlled definition of features on a tens of micron length scale in materials such as GaN which are resistant to wet chemical etching.
| Original language | English |
|---|---|
| Pages (from-to) | 262-264 |
| Number of pages | 3 |
| Journal | Materials Science and Engineering B |
| Volume | 82 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 22 May 2001 |
Keywords
- laser ablation
- femtosecond pulse laser
- gallium nitride
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