Failure mechanism of AlN nanocaps used to protect RE-implanted GaN during high temperature annealing

E. Nogales, R.W. Martin, K.P. O'Donnell, K. Lorenz, E. Alves, S. Ruffenach, O. Briot

Research output: Contribution to journalArticle

17 Citations (Scopus)

Fingerprint Dive into the research topics of 'Failure mechanism of AlN nanocaps used to protect RE-implanted GaN during high temperature annealing'. Together they form a unique fingerprint.

Physics & Astronomy

General

Engineering

Physics

Chemistry and Materials