Extended X-ray absorption fine structure studies of thulium doped GaN epilayers

V. Katchkanov, J. F.W. Mosselmans, S. Dalmasso, K. P. O'Donnell, S. Hernandez, K. Wang, R. W. Martin, O. Briot, N. Rousseau, G. Halambalakis, K. Lorenz, E. Alves

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