TY - JOUR
T1 - Etching and micro-optics fabrication in diamond using chlorine-based inductively-coupled plasma
AU - Lee, C.L.
AU - Gu, E.
AU - Dawson, M.D.
AU - Friel, I.
AU - Scarsbrook, G.
N1 - Also available as a conference paper at http://strathprints.strath.ac.uk/8989/
PY - 2008/7/12
Y1 - 2008/7/12
N2 - The effect of Inductively-Coupled Plasma (ICP) etching on diamond using chlorine-based plasma has been investigated. The diamond materials studied include type IIa natural diamond, High Pressure and High Temperature (HPHT) diamond and Chemical Vapour Deposition (CVD) diamond. It was found that argon and chlorine (Ar/Cl2) ICP plasma etching can improve the smoothness of the diamond surface. By using this method, a minimum root-mean-squared (rms) surface roughness of 0.19 nm has been achieved. To demonstrate optimized Ar/Cl2 plasma etching, diamond spherical micro-lenses and micro-trenches were fabricated. Compared to argon and oxygen (Ar/O2) plasma etching, Ar/Cl2 plasma etching has a low selectivity with respect to the photo-resist mask, which enables an accurate control over the dimensions of the microstructures fabricated. The surface quality and profiles of these micro-lenses and micro-trenches were characterized by atomic force microscopy (AFM) and were shown to be better than those fabricated by Ar/O2 ICP plasma.
AB - The effect of Inductively-Coupled Plasma (ICP) etching on diamond using chlorine-based plasma has been investigated. The diamond materials studied include type IIa natural diamond, High Pressure and High Temperature (HPHT) diamond and Chemical Vapour Deposition (CVD) diamond. It was found that argon and chlorine (Ar/Cl2) ICP plasma etching can improve the smoothness of the diamond surface. By using this method, a minimum root-mean-squared (rms) surface roughness of 0.19 nm has been achieved. To demonstrate optimized Ar/Cl2 plasma etching, diamond spherical micro-lenses and micro-trenches were fabricated. Compared to argon and oxygen (Ar/O2) plasma etching, Ar/Cl2 plasma etching has a low selectivity with respect to the photo-resist mask, which enables an accurate control over the dimensions of the microstructures fabricated. The surface quality and profiles of these micro-lenses and micro-trenches were characterized by atomic force microscopy (AFM) and were shown to be better than those fabricated by Ar/O2 ICP plasma.
KW - ICP etch
KW - chlorine-based plasma
KW - micro-optics
KW - surface smoothing
KW - inductively-coupled plasma etching
UR - http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TWV-4RJYV51-1&_user=875629&_rdoc=1&_fmt=&_orig=search&_sort=d&view=c&_acct=C000046979&_version=1&_urlVersion=0&_userid=875629&md5=ca786a21e1eb6f2ddf5302a89b307021
U2 - 10.1016/j.diamond.2008.01.011
DO - 10.1016/j.diamond.2008.01.011
M3 - Article
VL - 17
SP - 1292
EP - 1296
JO - Diamond and Related Materials
JF - Diamond and Related Materials
SN - 0925-9635
IS - 7-10
ER -