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Erratum: Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432))

  • S. Pereira*
  • , M. R. Correia
  • , E. Pereira
  • , K. P. O'Donnell
  • , E. Alves
  • , A. D. Sequeira
  • , N. Franco
  • *Corresponding author for this work

Research output: Contribution to journal › Comment/debate › peer-review

Original languageEnglish
Pages (from-to)337
Number of pages1
JournalApplied Physics Letters
Volume80
Issue number2
DOIs
Publication statusPublished - 14 Jan 2002

Keywords

  • x-ray diffraction
  • InGaN layers

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