Erratum: Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432))

S. Pereira, M. R. Correia, E. Pereira, K. P. O'Donnell, E. Alves, A. D. Sequeira, N. Franco

Research output: Contribution to journalComment/debate

6 Citations (Scopus)
LanguageEnglish
Pages337
Number of pages1
JournalApplied Physics Letters
Volume80
Issue number2
DOIs
Publication statusPublished - 14 Jan 2002

Keywords

  • x-ray diffraction
  • InGaN layers

Cite this

Pereira, S. ; Correia, M. R. ; Pereira, E. ; O'Donnell, K. P. ; Alves, E. ; Sequeira, A. D. ; Franco, N. / Erratum : Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432)). In: Applied Physics Letters. 2002 ; Vol. 80, No. 2. pp. 337.
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Erratum : Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432)). / Pereira, S.; Correia, M. R.; Pereira, E.; O'Donnell, K. P.; Alves, E.; Sequeira, A. D.; Franco, N.

In: Applied Physics Letters, Vol. 80, No. 2, 14.01.2002, p. 337.

Research output: Contribution to journalComment/debate

TY - JOUR

T1 - Erratum

T2 - Applied Physics Letters

AU - Pereira, S.

AU - Correia, M. R.

AU - Pereira, E.

AU - O'Donnell, K. P.

AU - Alves, E.

AU - Sequeira, A. D.

AU - Franco, N.

PY - 2002/1/14

Y1 - 2002/1/14

KW - x-ray diffraction

KW - InGaN layers

UR - http://www.scopus.com/inward/record.url?scp=79955990877&partnerID=8YFLogxK

U2 - 10.1063/1.1430029

DO - 10.1063/1.1430029

M3 - Comment/debate

VL - 80

SP - 337

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 2

ER -