Erratum: Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432))

S. Pereira, M. R. Correia, E. Pereira, K. P. O'Donnell, E. Alves, A. D. Sequeira, N. Franco

Research output: Contribution to journalComment/debate

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)337
Number of pages1
JournalApplied Physics Letters
Volume80
Issue number2
DOIs
Publication statusPublished - 14 Jan 2002

Keywords

  • x-ray diffraction
  • InGaN layers

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