Erratum: Interpretation of double x-ray diffraction peaks from InGaN layers (Applied Physics Letters (2001) 79 (1432))

S. Pereira, M. R. Correia, E. Pereira, K. P. O'Donnell, E. Alves, A. D. Sequeira, N. Franco

Research output: Contribution to journalComment/debatepeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)337
Number of pages1
JournalApplied Physics Letters
Issue number2
Publication statusPublished - 14 Jan 2002


  • x-ray diffraction
  • InGaN layers

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