Enhanced nonlinear refractive index in epsilon-near-zero materials

L. Caspani, R.P.M. Kaipurath, M. Clerici, M. Ferrera, T. Roger, J. Kim, N. Kinsey, M. Pietrzyk, A. Di Falco, V. M. Shalaev, A. Boltasseva, D. Faccio

Research output: Contribution to journalArticle

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Abstract

New propagation regimes for light arise from the ability to tune the dielectric permittivity to extremely low values. Here, we demonstrate a universal approach based on the low linear permittivity values attained in the ε-near-zero (ENZ) regime for enhancing the nonlinear refractive index, which enables remarkable light-induced changes of the material properties. Experiments performed on Al-doped ZnO (AZO) thin films show a sixfold increase of the Kerr nonlinear refractive index (n2) at the ENZ wavelength, located in the 1300 nm region. This in turn leads to ultrafast light-induced refractive index changes of the order of unity, thus representing a new paradigm for nonlinear optics.
LanguageEnglish
Article number233901
Number of pages5
JournalPhysical Review Letters
Volume116
Issue number23
DOIs
Publication statusPublished - 8 Jun 2016

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refractivity
permittivity
nonlinear optics
unity
propagation
thin films
wavelengths

Keywords

  • nonlinear optical behaviour
  • nonlinear refractive index
  • nonlinear optics

Cite this

Caspani, L., Kaipurath, R. P. M., Clerici, M., Ferrera, M., Roger, T., Kim, J., ... Faccio, D. (2016). Enhanced nonlinear refractive index in epsilon-near-zero materials. Physical Review Letters, 116(23), [233901]. https://doi.org/10.1103/PhysRevLett.116.233901
Caspani, L. ; Kaipurath, R.P.M. ; Clerici, M. ; Ferrera, M. ; Roger, T. ; Kim, J. ; Kinsey, N. ; Pietrzyk, M. ; Di Falco, A. ; Shalaev, V. M. ; Boltasseva, A. ; Faccio, D. / Enhanced nonlinear refractive index in epsilon-near-zero materials. In: Physical Review Letters. 2016 ; Vol. 116, No. 23.
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Caspani, L, Kaipurath, RPM, Clerici, M, Ferrera, M, Roger, T, Kim, J, Kinsey, N, Pietrzyk, M, Di Falco, A, Shalaev, VM, Boltasseva, A & Faccio, D 2016, 'Enhanced nonlinear refractive index in epsilon-near-zero materials' Physical Review Letters, vol. 116, no. 23, 233901. https://doi.org/10.1103/PhysRevLett.116.233901

Enhanced nonlinear refractive index in epsilon-near-zero materials. / Caspani, L.; Kaipurath, R.P.M.; Clerici, M.; Ferrera, M.; Roger, T.; Kim, J.; Kinsey, N.; Pietrzyk, M.; Di Falco, A.; Shalaev, V. M.; Boltasseva, A.; Faccio, D.

In: Physical Review Letters, Vol. 116, No. 23, 233901, 08.06.2016.

Research output: Contribution to journalArticle

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AU - Caspani, L.

AU - Kaipurath, R.P.M.

AU - Clerici, M.

AU - Ferrera, M.

AU - Roger, T.

AU - Kim, J.

AU - Kinsey, N.

AU - Pietrzyk, M.

AU - Di Falco, A.

AU - Shalaev, V. M.

AU - Boltasseva, A.

AU - Faccio, D.

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