Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope

Elena Pascal, Saransh Singh, Patrick G. Callahan, Ben Hourahine, Carol Trager-Cowan, Marc De Graef

Research output: Contribution to journalArticle

Abstract

Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries.
LanguageEnglish
Pages98-106
Number of pages9
JournalUltramicroscopy
Volume187
Early online date2 Feb 2018
DOIs
Publication statusPublished - 30 Apr 2018

Fingerprint

Electron diffraction
Electron microscopes
electron diffraction
electron microscopes
Diffraction
Scattering
Scanning
scanning
scattering
diffraction
simulation
energy
Electrons
dictionaries
sharpness
Inelastic scattering
Hough transforms
Glossaries
foils
inelastic scattering

Keywords

  • Transmission Kikuchi diffraction
  • TKD
  • electron back-scattered diffraction
  • EBSD
  • scanning electron microscopes
  • SEM
  • electrons
  • foil thickness
  • energy filtering
  • dynamical simulations
  • Monte Carlo

Cite this

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title = "Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope",
abstract = "Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries.",
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Energy-weighted dynamical scattering simulations of electron diffraction modalites in the scanning electron microscope. / Pascal, Elena; Singh, Saransh; Callahan, Patrick G.; Hourahine, Ben; Trager-Cowan, Carol; De Graef, Marc.

In: Ultramicroscopy, Vol. 187, 30.04.2018, p. 98-106.

Research output: Contribution to journalArticle

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AU - Singh, Saransh

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AU - De Graef, Marc

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