Electrostatic suppression of the "coffee-stain effect"

Alexander W. Wray, Demetrios T. Papageorgiou, Richard V. Craster, Khellil Sefiane, Omar K. Matar

Research output: Contribution to journalArticle

1 Citation (Scopus)
72 Downloads (Pure)

Abstract

The dynamics of a slender, nano-particle laden droplet are examined when it is subjected to an electric field. Under a long-wave assumption, the governing equations are reduced to a coupled pair of nonlinear evolution equations prescribing the dynamics of the interface and the depth-averaged particle concentration. This incorporates the effects of viscous stress, capillarity, electrostatically- induced Maxwell stress, van der Waals forces, evaporation and concentration-dependent rheology. It has previously been shown27 that electric fields can be used to suppress the ring effect typically exhibited when such a droplet undergoes evaporation. We demonstrate here that the use of electric fields affords many diverse ways of controlling the droplets.

Original languageEnglish
Pages (from-to)172-177
Number of pages6
JournalProcedia IUTAM
Volume15
DOIs
Publication statusPublished - 28 May 2015
EventIUTAM Symposium on Multiphase Flows with Phase Change - Hyderabad, India
Duration: 8 Dec 201411 Dec 2014
http://www.iith.ac.in/~iutam2014/

Fingerprint

Coffee
Electrostatics
Electric fields
Evaporation
Van der Waals forces
Capillarity
Rheology

Keywords

  • droplet
  • electrostatics
  • evaporation
  • nanoparticles
  • thin-film

Cite this

Wray, Alexander W. ; Papageorgiou, Demetrios T. ; Craster, Richard V. ; Sefiane, Khellil ; Matar, Omar K. / Electrostatic suppression of the "coffee-stain effect". In: Procedia IUTAM. 2015 ; Vol. 15. pp. 172-177.
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Electrostatic suppression of the "coffee-stain effect". / Wray, Alexander W.; Papageorgiou, Demetrios T.; Craster, Richard V.; Sefiane, Khellil; Matar, Omar K.

In: Procedia IUTAM, Vol. 15, 28.05.2015, p. 172-177.

Research output: Contribution to journalArticle

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