Electron channeling contrast imaging of defects in III-nitride semiconductors

C. Trager-Cowan, G. Naresh-Kumar, N. Allehiani, S. Kraeusel, B. Hourahine, S. Vespucci, D. Thomson, J. Bruckbauer, G. Kusch, P. R. Edwards, R. W. Martin, C. Mauder, A. P. Day, A. Winkelmann, A. Vilalta-Clemente, A. J. Wilkinson, P. J. Parbrook, M. J. Kappers, M. A. Moram, R. A. OliverC. J. Humphreys, P. Shields, E. D. Le Boulbar, D. Maneuski, V. O'Shea, K. P. Mingard

Research output: Contribution to journalConference Contribution

71 Downloads (Pure)
Original languageEnglish
Pages (from-to)1024-1025
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue numberS3
DOIs
Publication statusPublished - Aug 2014
EventMicroscopy & Microanalysis 2014 - Connecticut, Hartford, United States
Duration: 3 Aug 20147 Aug 2014

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