Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures

C. Trager-Cowan, P. J. Parbrook, D. Clark, B. Henderson, K. P. O'Donnell, B. Cockayne, P. J. Wright

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

4 Citations (Scopus)

Abstract

The variation of penetration depth of an electron beam with energy is used to profile the luminescence properties of CdSe-ZnSe multiple quantum well and strained layer superlattice structures. Luminescence from different layers within the multilayered structures, gives rise to multicolored emission.

Original languageEnglish
Title of host publicationInstitute of Physics Conference Series
Place of PublicationLondon
Pages715-718
Number of pages4
Edition117
Publication statusPublished - 1 Dec 1991
EventProceedings of the Conference on Microscopy of Semiconducting Materials 1991 - Oxford, Engl
Duration: 25 Mar 199128 Mar 1991

Conference

ConferenceProceedings of the Conference on Microscopy of Semiconducting Materials 1991
CityOxford, Engl
Period25/03/9128/03/91

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