Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures

C. Trager-Cowan; P. J. Parbrook; D. Clark; B. Henderson; K. P. O'Donnell; B. Cockayne; P. J. Wright

Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures

C. Trager-Cowan, P. J. Parbrook, D. Clark, B. Henderson, K. P. O'Donnell, B. Cockayne, P. J. Wright

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book

Abstract

The variation of penetration depth of an electron beam with energy is used to profile the luminescence properties of CdSe-ZnSe multiple quantum well and strained layer superlattice structures. Luminescence from different layers within the multilayered structures, gives rise to multicolored emission.

Original language	English
Title of host publication	Institute of Physics Conference Series
Place of Publication	London
Pages	715-718
Number of pages	4
Edition	117
Publication status	Published - 1 Dec 1991
Event	Proceedings of the Conference on Microscopy of Semiconducting Materials 1991 - Oxford, Engl Duration: 25 Mar 1991 → 28 Mar 1991

Conference

Conference	Proceedings of the Conference on Microscopy of Semiconducting Materials 1991
City	Oxford, Engl
Period	25/03/91 → 28/03/91

Cite this

@inproceedings{c8d17b2544b94c7ebc0481c621f1a835,

title = "Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures",

abstract = "The variation of penetration depth of an electron beam with energy is used to profile the luminescence properties of CdSe-ZnSe multiple quantum well and strained layer superlattice structures. Luminescence from different layers within the multilayered structures, gives rise to multicolored emission.",

author = "C. Trager-Cowan and Parbrook, {P. J.} and D. Clark and B. Henderson and O'Donnell, {K. P.} and B. Cockayne and Wright, {P. J.}",

year = "1991",

month = dec,

day = "1",

language = "English",

isbn = "0854984062",

pages = "715--718",

booktitle = "Institute of Physics Conference Series",

edition = "117",

note = "Proceedings of the Conference on Microscopy of Semiconducting Materials 1991 ; Conference date: 25-03-1991 Through 28-03-1991",

}

Trager-Cowan, C, Parbrook, PJ, Clark, D, Henderson, B, O'Donnell, KP, Cockayne, B & Wright, PJ 1991, Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures. in Institute of Physics Conference Series. 117 edn, London, pp. 715-718, Proceedings of the Conference on Microscopy of Semiconducting Materials 1991, Oxford, Engl, 25/03/91.

TY - GEN

T1 - Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures

AU - Trager-Cowan, C.

AU - Parbrook, P. J.

AU - Clark, D.

AU - Henderson, B.

AU - O'Donnell, K. P.

AU - Cockayne, B.

AU - Wright, P. J.

PY - 1991/12/1

Y1 - 1991/12/1

N2 - The variation of penetration depth of an electron beam with energy is used to profile the luminescence properties of CdSe-ZnSe multiple quantum well and strained layer superlattice structures. Luminescence from different layers within the multilayered structures, gives rise to multicolored emission.

AB - The variation of penetration depth of an electron beam with energy is used to profile the luminescence properties of CdSe-ZnSe multiple quantum well and strained layer superlattice structures. Luminescence from different layers within the multilayered structures, gives rise to multicolored emission.

UR - http://www.scopus.com/inward/record.url?scp=0026360306&partnerID=8YFLogxK

M3 - Conference contribution book

AN - SCOPUS:0026360306

SN - 0854984062

SP - 715

EP - 718

BT - Institute of Physics Conference Series

CY - London

T2 - Proceedings of the Conference on Microscopy of Semiconducting Materials 1991

Y2 - 25 March 1991 through 28 March 1991

ER -

Electron beam excitation and profiling of CdSe-ZnSe multiple quantum well and strained layer superlattice structures

Abstract

Conference

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