Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

N. Gosvami; K. H. A. Lau; S. K. Sinha; S. J. O'Shea

doi:10.1016/j.apsusc.2005.09.050

Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

N. Gosvami, K. H. A. Lau, S. K. Sinha, S. J. O'Shea

Pure And Applied Chemistry

Research output: Contribution to journal › Conference Contribution › peer-review

8 Citations (Scopus)

Abstract

Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	3956-3960
Number of pages	5
Journal	Applied Surface Science
Volume	252
Issue number	11
DOIs	https://doi.org/10.1016/j.apsusc.2005.09.050
Publication status	Published - 31 Mar 2006
Event	ICMAT 05: Symposium L : The 3rd International Conference on Materials for Advanced Technologies (ICMAT 2005) - , Singapore Duration: 3 Jul 2005 → 8 Jul 2005

Keywords

au(111)
metal-molecule-metal junctions
self-assembled monolayer
current sensing
atomic force
microscopy
self-assembled monolayers
atomic-force microscopy
work function

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10.1016/j.apsusc.2005.09.050

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title = "Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM",

abstract = "Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.",

keywords = "au(111), metal-molecule-metal junctions, self-assembled monolayer, current sensing , atomic force, microscopy, self-assembled monolayers, atomic-force microscopy, work function",

author = "N. Gosvami and Lau, {K. H. A.} and Sinha, {S. K.} and O'Shea, {S. J.}",

note = "M1 - 11 Times Cited: 5 3rd International Conference on Materials for Advanced Technologies/9th International Conference on Advanced Materials Jul 03-08, 2005, Singapore, SINGAPORE; ICMAT 05: Symposium L : The 3rd International Conference on Materials for Advanced Technologies (ICMAT 2005) ; Conference date: 03-07-2005 Through 08-07-2005",

year = "2006",

month = mar,

day = "31",

doi = "10.1016/j.apsusc.2005.09.050",

language = "English",

volume = "252",

pages = "3956--3960",

journal = "Applied Surface Science",

issn = "0169-4332",

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TY - JOUR

T1 - Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

AU - Gosvami, N.

AU - Lau, K. H. A.

AU - Sinha, S. K.

AU - O'Shea, S. J.

N1 - M1 - 11 Times Cited: 5 3rd International Conference on Materials for Advanced Technologies/9th International Conference on Advanced Materials Jul 03-08, 2005, Singapore, SINGAPORE

PY - 2006/3/31

Y1 - 2006/3/31

N2 - Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

AB - Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

KW - au(111)

KW - metal-molecule-metal junctions

KW - self-assembled monolayer

KW - current sensing

KW - atomic force

KW - microscopy

KW - self-assembled monolayers

KW - atomic-force microscopy

KW - work function

U2 - 10.1016/j.apsusc.2005.09.050

DO - 10.1016/j.apsusc.2005.09.050

M3 - Conference Contribution

SN - 0169-4332

VL - 252

SP - 3956

EP - 3960

JO - Applied Surface Science

JF - Applied Surface Science

IS - 11

T2 - ICMAT 05: Symposium L : The 3rd International Conference on Materials for Advanced Technologies (ICMAT 2005)

Y2 - 3 July 2005 through 8 July 2005

ER -

Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

Abstract

Keywords

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