Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

N. Gosvami, K. H. A. Lau, S. K. Sinha, S. J. O'Shea

Research output: Contribution to journalConference Contribution

7 Citations (Scopus)

Abstract

Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)3956-3960
Number of pages5
JournalApplied Surface Science
Volume252
Issue number11
DOIs
Publication statusPublished - 31 Mar 2006
EventICMAT 05: Symposium L : The 3rd International Conference on Materials for Advanced Technologies (ICMAT 2005) - , Singapore
Duration: 3 Jul 20058 Jul 2005

Keywords

  • au(111)
  • metal-molecule-metal junctions
  • self-assembled monolayer
  • current sensing
  • atomic force
  • microscopy
  • self-assembled monolayers
  • atomic-force microscopy
  • work function

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