Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

N. Gosvami, K. H. A. Lau, S. K. Sinha, S. J. O'Shea

Research output: Contribution to journalConference Contribution

7 Citations (Scopus)

Abstract

Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

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Contact resistance
Metals
Molecules
Self assembled monolayers
Charge transfer
Molecular electronics
Atomic force microscopy
Tuning
Liquids
Substrates

Keywords

  • au(111)
  • metal-molecule-metal junctions
  • self-assembled monolayer
  • current sensing
  • atomic force
  • microscopy
  • self-assembled monolayers
  • atomic-force microscopy
  • work function

Cite this

@article{4fd53cbc05be480bb44799ca42e4a3b9,
title = "Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM",
abstract = "Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.",
keywords = "au(111), metal-molecule-metal junctions, self-assembled monolayer, current sensing , atomic force, microscopy, self-assembled monolayers, atomic-force microscopy, work function",
author = "N. Gosvami and Lau, {K. H. A.} and Sinha, {S. K.} and O'Shea, {S. J.}",
note = "M1 - 11 Times Cited: 5 3rd International Conference on Materials for Advanced Technologies/9th International Conference on Advanced Materials Jul 03-08, 2005, Singapore, SINGAPORE",
year = "2006",
month = "3",
day = "31",
doi = "10.1016/j.apsusc.2005.09.050",
language = "English",
volume = "252",
pages = "3956--3960",
journal = "Applied Surface Science",
issn = "0169-4332",
number = "11",

}

Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM. / Gosvami, N.; Lau, K. H. A.; Sinha, S. K.; O'Shea, S. J.

In: Applied Surface Science, Vol. 252, No. 11, 31.03.2006, p. 3956-3960.

Research output: Contribution to journalConference Contribution

TY - JOUR

T1 - Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

AU - Gosvami, N.

AU - Lau, K. H. A.

AU - Sinha, S. K.

AU - O'Shea, S. J.

N1 - M1 - 11 Times Cited: 5 3rd International Conference on Materials for Advanced Technologies/9th International Conference on Advanced Materials Jul 03-08, 2005, Singapore, SINGAPORE

PY - 2006/3/31

Y1 - 2006/3/31

N2 - Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

AB - Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

KW - au(111)

KW - metal-molecule-metal junctions

KW - self-assembled monolayer

KW - current sensing

KW - atomic force

KW - microscopy

KW - self-assembled monolayers

KW - atomic-force microscopy

KW - work function

U2 - 10.1016/j.apsusc.2005.09.050

DO - 10.1016/j.apsusc.2005.09.050

M3 - Conference Contribution

VL - 252

SP - 3956

EP - 3960

JO - Applied Surface Science

T2 - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

IS - 11

ER -