Dynamics of the development of an electrical field across cellular membranes-PEF inactivation of microorganisms

I. Timoshkin, J.W. Mackersie, S.J. MacGregor, R.A. Fouracre, J.G. Anderson

Research output: Contribution to conferencePaper

Abstract

The pulsed electric field (PEF) processing of liquid and pumpable products has attracted significant interest from the pulsed power and bioscience research communities due to the nonthermal mechanisms of inactivation which results in preservation of the original characteristics of the product. Although the PEF process has been studied for several decades, the physical mechanisms of the interaction of pulsed electrical fields with microorganisms is still not understood fully. The present work is a study of the dynamics of the electrical field in the PEF treatment chamber with dielectric barriers and in the microorganism's membrane. It was found that the field in the membrane reaches a maximal value which could be two orders of magnitude higher than the original electrical field in the chamber and this value was attained in a time comparable to the Maxwell-Wagner relaxation time, τMW. Thus, the optimal duration of the field pulse during the PEF treatment should be equal to the time τMW
Original languageEnglish
Pages611-614
Number of pages3
DOIs
Publication statusPublished - May 2004
Event26th International Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop - , United Kingdom
Duration: 23 May 200426 May 2004

Conference

Conference26th International Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop
CountryUnited Kingdom
Period23/05/0426/05/04

Keywords

  • dynamics
  • development
  • electrical field
  • cellular membranes
  • PEF inactivation
  • microorganisms

Cite this

Timoshkin, I., Mackersie, J. W., MacGregor, S. J., Fouracre, R. A., & Anderson, J. G. (2004). Dynamics of the development of an electrical field across cellular membranes-PEF inactivation of microorganisms. 611-614. Paper presented at 26th International Power Modulator Symposium, 2004 and 2004 High-Voltage Workshop , United Kingdom. https://doi.org/10.1109/MODSYM.2004.1433651