Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

Elena Pascal; Saransh Singh; Ben Hourahine; Carol Trager-Cowan; Marc De Graef

doi:10.1017/S1431927617003385

Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

Elena Pascal, Saransh Singh, Ben Hourahine, Carol Trager-Cowan, Marc De Graef

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Abstract

Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.

Original language	English
Pages (from-to)	540-541
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	23
Issue number	S1
DOIs	https://doi.org/10.1017/S1431927617003385
Publication status	Published - 4 Aug 2017

Keywords

electron backscatter diffraction (EBSD)
electron backscatterlike patterns (EBSP)
transmission Kikuchi diffraction (TKD) patterns

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10.1017/S1431927617003385

Pascal-etal-2017-Dynamical-Simulations-of-Transmission-KikuchiAccepted author manuscript, 685 KB

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title = "Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns",

abstract = "Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.",

keywords = "electron backscatter diffraction (EBSD), electron backscatterlike patterns (EBSP), transmission Kikuchi diffraction (TKD) patterns",

author = "Elena Pascal and Saransh Singh and Ben Hourahine and Carol Trager-Cowan and {De Graef}, Marc",

year = "2017",

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doi = "10.1017/S1431927617003385",

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T1 - Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

AU - Pascal, Elena

AU - Singh, Saransh

AU - Hourahine, Ben

AU - Trager-Cowan, Carol

AU - De Graef, Marc

PY - 2017/8/4

Y1 - 2017/8/4

N2 - Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.

AB - Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.

KW - electron backscatter diffraction (EBSD)

KW - electron backscatterlike patterns (EBSP)

KW - transmission Kikuchi diffraction (TKD) patterns

UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/

U2 - 10.1017/S1431927617003385

DO - 10.1017/S1431927617003385

M3 - Conference Contribution

SN - 1431-9276

VL - 23

SP - 540

EP - 541

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S1

ER -

Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

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