Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

Elena Pascal, Saransh Singh, Ben Hourahine, Carol Trager-Cowan, Marc De Graef

Research output: Contribution to journalConference Contribution

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Abstract

Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.
Original languageEnglish
Pages (from-to)540-541
Number of pages2
JournalMicroscopy and Microanalysis
Volume23
Issue numberS1
DOIs
Publication statusPublished - 4 Aug 2017

Fingerprint

Electron diffraction
Diffraction patterns
diffraction patterns
Electrons
Mountings
Nanostructured materials
Metal foil
electrons
simulation
Cameras
Transmission electron microscopy
mounting
diffraction
foils
acquisition
spatial resolution
cameras
transmission electron microscopy
interactions

Keywords

  • electron backscatter diffraction (EBSD)
  • electron backscatterlike patterns (EBSP)
  • transmission Kikuchi diffraction (TKD) patterns

Cite this

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title = "Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns",
abstract = "Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.",
keywords = "electron backscatter diffraction (EBSD), electron backscatterlike patterns (EBSP), transmission Kikuchi diffraction (TKD) patterns",
author = "Elena Pascal and Saransh Singh and Ben Hourahine and Carol Trager-Cowan and {De Graef}, Marc",
year = "2017",
month = "8",
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doi = "10.1017/S1431927617003385",
language = "English",
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journal = "Microscopy and Microanalysis",
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Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns. / Pascal, Elena; Singh, Saransh; Hourahine, Ben; Trager-Cowan, Carol; De Graef, Marc.

In: Microscopy and Microanalysis, Vol. 23, No. S1, 04.08.2017, p. 540-541.

Research output: Contribution to journalConference Contribution

TY - JOUR

T1 - Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns

AU - Pascal, Elena

AU - Singh, Saransh

AU - Hourahine, Ben

AU - Trager-Cowan, Carol

AU - De Graef, Marc

PY - 2017/8/4

Y1 - 2017/8/4

N2 - Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.

AB - Truly nanostructured materials pose a significant spatial resolution challenge to the conventional Electron Backscatter Diffraction (EBSD) characterization technique. Nevertheless, the interaction volume can be reduced by the use of electron transparent samples and the acquisition of electron backscatterlike patterns (EBSP) in transmission mode instead. These transmission Kikuchi diffraction (TKD) patterns are typically acquired by mounting a thin foil, similar to transmission electron microscopy (TEM), and tilting it at a slight angle (20◦ -30◦ ) from horizontal towards a standard EBSD camera.

KW - electron backscatter diffraction (EBSD)

KW - electron backscatterlike patterns (EBSP)

KW - transmission Kikuchi diffraction (TKD) patterns

UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/

U2 - 10.1017/S1431927617003385

DO - 10.1017/S1431927617003385

M3 - Conference Contribution

VL - 23

SP - 540

EP - 541

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - S1

ER -