Dynamic strain measurement using an extrinsic Fabry-Perot interferometric sensor and an arrayed waveguide grating device

A.J. Willshire; P. Niewczas; L. Dziuda; G. Fusiek; J.R. McDonald

doi:10.1109/TIM.2003.821480

Dynamic strain measurement using an extrinsic Fabry-Perot interferometric sensor and an arrayed waveguide grating device

A.J. Willshire, P. Niewczas, L. Dziuda, G. Fusiek, J.R. McDonald

Electronic And Electrical Engineering

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

In this paper, we demonstrate an interrogation system based on an arrayed waveguide grating capable of monitoring dynamic strain in a cantilever beam at frequencies up to 5 kHz (limited by the actuator) with a similar precision to resistive strain gauges.

Original language	English
Pages (from-to)	4-9
Number of pages	5
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	53
Issue number	1
DOIs	https://doi.org/10.1109/TIM.2003.821480
Publication status	Published - 2004

Keywords

waveguide grating
Fabry-Perot interferometer
optical sensor
strain measurement
optoelectronics

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@article{8c11a2a5d6104181918aac7eb9ad814d,

title = "Dynamic strain measurement using an extrinsic Fabry-Perot interferometric sensor and an arrayed waveguide grating device",

abstract = "In this paper, we demonstrate an interrogation system based on an arrayed waveguide grating capable of monitoring dynamic strain in a cantilever beam at frequencies up to 5 kHz (limited by the actuator) with a similar precision to resistive strain gauges.",

keywords = "waveguide grating, Fabry-Perot interferometer, optical sensor, strain measurement, optoelectronics",

author = "A.J. Willshire and P. Niewczas and L. Dziuda and G. Fusiek and J.R. McDonald",

year = "2004",

doi = "10.1109/TIM.2003.821480",

language = "English",

volume = "53",

pages = "4--9",

journal = "IEEE Transactions on Instrumentation and Measurement",

issn = "0018-9456",

number = "1",

}

TY - JOUR

T1 - Dynamic strain measurement using an extrinsic Fabry-Perot interferometric sensor and an arrayed waveguide grating device

AU - Willshire, A.J.

AU - Niewczas, P.

AU - Dziuda, L.

AU - Fusiek, G.

AU - McDonald, J.R.

PY - 2004

Y1 - 2004

N2 - In this paper, we demonstrate an interrogation system based on an arrayed waveguide grating capable of monitoring dynamic strain in a cantilever beam at frequencies up to 5 kHz (limited by the actuator) with a similar precision to resistive strain gauges.

AB - In this paper, we demonstrate an interrogation system based on an arrayed waveguide grating capable of monitoring dynamic strain in a cantilever beam at frequencies up to 5 kHz (limited by the actuator) with a similar precision to resistive strain gauges.

KW - waveguide grating

KW - Fabry-Perot interferometer

KW - optical sensor

KW - strain measurement

KW - optoelectronics

UR - http://dx.doi.org/10.1109/TIM.2003.821480

U2 - 10.1109/TIM.2003.821480

DO - 10.1109/TIM.2003.821480

M3 - Article

SN - 0018-9456

VL - 53

SP - 4

EP - 9

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

IS - 1

ER -

Dynamic strain measurement using an extrinsic Fabry-Perot interferometric sensor and an arrayed waveguide grating device

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