Disorder mapping in VCSELs using frequency-selective feedback

Thorsten Ackemann, Neal Matthew Radwell, Yoann Noblet, R. Jaeger

Research output: Contribution to journalArticle

9 Citations (Scopus)
71 Downloads (Pure)

Abstract

We report on a simple method with a high spectral and spatial resolution for mapping variations in the cavity resonance of a plano-planar broad-area laser based on frequency-selective feedback. The demonstration experiment uses a vertical-cavity surface-emitting-laser (VCSEL), in which growth induced inhomogeneities are of particular importance. It relies only on a standalone laser with a narrow-bandwidth passive filter avoiding the need for an expensive tunable laser or high-resolution spectrometer.
Original languageEnglish
Pages (from-to)1079-1081
Number of pages3
JournalOptics Letters
Volume37
Issue number6
DOIs
Publication statusPublished - 2012

Fingerprint

disorders
cavities
high resolution
tunable lasers
surface emitting lasers
spectral resolution
lasers
inhomogeneity
spatial resolution
spectrometers
bandwidth
filters

Keywords

  • disorder mapping
  • VCSEL
  • frequency-selective feedback

Cite this

Ackemann, Thorsten ; Radwell, Neal Matthew ; Noblet, Yoann ; Jaeger, R. / Disorder mapping in VCSELs using frequency-selective feedback. In: Optics Letters. 2012 ; Vol. 37, No. 6. pp. 1079-1081.
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Disorder mapping in VCSELs using frequency-selective feedback. / Ackemann, Thorsten; Radwell, Neal Matthew; Noblet, Yoann; Jaeger, R.

In: Optics Letters, Vol. 37, No. 6, 2012, p. 1079-1081.

Research output: Contribution to journalArticle

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