Disorder mapping in VCSELs using frequency-selective feedback

Thorsten Ackemann, Neal Matthew Radwell, Yoann Noblet, R. Jaeger

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Abstract

We report on a simple method with a high spectral and spatial resolution for mapping variations in the cavity resonance of a plano-planar broad-area laser based on frequency-selective feedback. The demonstration experiment uses a vertical-cavity surface-emitting-laser (VCSEL), in which growth induced inhomogeneities are of particular importance. It relies only on a standalone laser with a narrow-bandwidth passive filter avoiding the need for an expensive tunable laser or high-resolution spectrometer.
Original languageEnglish
Pages (from-to)1079-1081
Number of pages3
JournalOptics Letters
Volume37
Issue number6
DOIs
Publication statusPublished - 2012

Keywords

  • disorder mapping
  • VCSEL
  • frequency-selective feedback

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