Digital method for testing Analogue Circuits

David Hamilton; Brian Stimpson

Digital method for testing Analogue Circuits

David Hamilton (Inventor), Brian Stimpson (Inventor)

Electronic And Electrical Engineering

Research output: Patent

Original language	English
Publication status	Published - 24 Dec 2003

Cite this

TY - PAT

T1 - Digital method for testing Analogue Circuits

AU - Hamilton, David

AU - Stimpson, Brian

N1 - Additional Inventor(s): Mahmoud Bekheit United Kingdom; File Date: 17-JUN-02; Serial No: 0213882.4; Status: Abandoned United States; File Date: 17-JUN-03; Serial No: 10/518,743; Status: Granted Japan; File Date: 17-JUL-03; Serial No: 2004-513786; Status: Filed European; File Date: 17-JAN-03; Serial No: 03760088.9; Status: Published

PY - 2003/12/24

Y1 - 2003/12/24

M3 - Patent

ER -