Digital method for testing Analogue Circuits

David Hamilton (Inventor), Brian Stimpson (Inventor)

Research output: Patent

LanguageEnglish
Publication statusPublished - 24 Dec 2003

Cite this

Hamilton, D., & Stimpson, B. (2003). Digital method for testing Analogue Circuits.
Hamilton, David (Inventor) ; Stimpson, Brian (Inventor). / Digital method for testing Analogue Circuits.
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title = "Digital method for testing Analogue Circuits",
author = "David Hamilton and Brian Stimpson",
year = "2003",
month = "12",
day = "24",
language = "English",
type = "Patent",

}

Hamilton, D & Stimpson, B 2003, Digital method for testing Analogue Circuits.

Digital method for testing Analogue Circuits. / Hamilton, David (Inventor); Stimpson, Brian (Inventor).

Research output: Patent

TY - PAT

T1 - Digital method for testing Analogue Circuits

AU - Hamilton, David

AU - Stimpson, Brian

N1 - Additional Inventor(s): Mahmoud Bekheit<br/><br/>United Kingdom; File Date: 17-JUN-02; Serial No: 0213882.4; Status: Abandoned<br/>United States; File Date: 17-JUN-03; Serial No: 10/518,743; Status: Granted<br/>Japan; File Date: 17-JUL-03; Serial No: 2004-513786; Status: Filed<br/>European; File Date: 17-JAN-03; Serial No: 03760088.9; Status: Published

PY - 2003/12/24

Y1 - 2003/12/24

M3 - Patent

ER -

Hamilton D, Stimpson B, inventors. Digital method for testing Analogue Circuits. 2003 Dec 24.