Projects per year
We describe a general method to determine the location of a point source of waves relative to a two-dimensional single-crystalline active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. The principle described here can be applied to various types of waves provided that the detector elements are suitably structured. As a prototypical practical application of the general detection principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This approach provides a promising alternative method to calibrate Kikuchi patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
- pixel detector
- crystalline sensor materials
Research Output per year
Trager-Cowan, C., Maneuski, D., O'Shea, V. & Winkelmann, A., 17 Jul 2016, Ithaca, NY, 5 p.
Research output: Working paper
Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K. P., Maneuski, D., O'Shea, V., & Winkelmann, A. (2017). Diffractive triangulation of radiative point sources. Applied Physics Letters, 110(12), . https://doi.org/10.1063/1.4978858