Diffractive triangulation of radiative point sources

Stefano Vespucci, Carol Trager-Cowan, Dzmitry Maneuski, Val O'Shea, Aimo Winkelmann

Research output: Working paper

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Abstract

We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
Original languageEnglish
Place of PublicationIthaca, NY
Number of pages5
Publication statusPublished - 17 Jul 2016

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Keywords

  • instrumentation
  • pixel detector
  • crystalline sensor materials

Cite this

Vespucci, S., Trager-Cowan, C., Maneuski, D., O'Shea, V., & Winkelmann, A. (2016). Diffractive triangulation of radiative point sources. Ithaca, NY.