Abstract
| Language | English |
|---|---|
| Place of Publication | Ithaca, NY |
| Number of pages | 5 |
| Publication status | Published - 17 Jul 2016 |
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Keywords
- instrumentation
- pixel detector
- crystalline sensor materials
Cite this
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Diffractive triangulation of radiative point sources. / Vespucci, Stefano; Trager-Cowan, Carol; Maneuski, Dzmitry; O'Shea, Val; Winkelmann, Aimo.
Ithaca, NY, 2016.Research output: Working paper
TY - UNPB
T1 - Diffractive triangulation of radiative point sources
AU - Vespucci, Stefano
AU - Trager-Cowan, Carol
AU - Maneuski, Dzmitry
AU - O'Shea, Val
AU - Winkelmann, Aimo
N1 - 5 pages, 4 figures
PY - 2016/7/17
Y1 - 2016/7/17
N2 - We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
AB - We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
KW - instrumentation
KW - pixel detector
KW - crystalline sensor materials
UR - https://arxiv.org/abs/1607.05269
M3 - Working paper
BT - Diffractive triangulation of radiative point sources
CY - Ithaca, NY
ER -