Projects per year
Abstract
We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
Original language | English |
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Place of Publication | Ithaca, NY |
Number of pages | 5 |
Publication status | Published - 17 Jul 2016 |
Keywords
- instrumentation
- pixel detector
- crystalline sensor materials
Projects
- 1 Finished
Datasets
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Data for Diffractive triangulation of radiative point sources
Vespucci, S. (Creator), Gunasekar, N. (Contributor), Trager-Cowan, C. (Contributor), Maneuski, D. (Contributor), O'Shea, V. (Contributor), Mingard, K. (Contributor) & Winkelmann, A. (Creator), University of Strathclyde, 25 Apr 2017
DOI: 10.15129/93155663-d967-4ebb-81e2-0964befe80b6
Dataset
Research Output
- 1 Article
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Diffractive triangulation of radiative point sources
Vespucci, S., Naresh-Kumar, G., Trager-Cowan, C., Mingard, K. P., Maneuski, D., O'Shea, V. & Winkelmann, A., 24 Mar 2017, In: Applied Physics Letters. 110, 12, 5 p., 124103.Research output: Contribution to journal › Article › peer-review
Open AccessFile1 Citation (Scopus)47 Downloads (Pure)