Diffractive triangulation of radiative point sources

Stefano Vespucci, Carol Trager-Cowan, Dzmitry Maneuski, Val O'Shea, Aimo Winkelmann

Research output: Working paper

Abstract

We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.
LanguageEnglish
Place of PublicationIthaca, NY
Number of pages5
Publication statusPublished - 17 Jul 2016

Fingerprint

triangulation
point sources
diffraction patterns
detectors
pixels
emitters
electron microscopes
scanning
sensitivity
sensors
crystals
electrons

Keywords

  • instrumentation
  • pixel detector
  • crystalline sensor materials

Cite this

Vespucci, S., Trager-Cowan, C., Maneuski, D., O'Shea, V., & Winkelmann, A. (2016). Diffractive triangulation of radiative point sources. Ithaca, NY.
Vespucci, Stefano ; Trager-Cowan, Carol ; Maneuski, Dzmitry ; O'Shea, Val ; Winkelmann, Aimo. / Diffractive triangulation of radiative point sources. Ithaca, NY, 2016.
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abstract = "We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.",
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Vespucci, S, Trager-Cowan, C, Maneuski, D, O'Shea, V & Winkelmann, A 2016 'Diffractive triangulation of radiative point sources' Ithaca, NY.

Diffractive triangulation of radiative point sources. / Vespucci, Stefano; Trager-Cowan, Carol; Maneuski, Dzmitry; O'Shea, Val; Winkelmann, Aimo.

Ithaca, NY, 2016.

Research output: Working paper

TY - UNPB

T1 - Diffractive triangulation of radiative point sources

AU - Vespucci, Stefano

AU - Trager-Cowan, Carol

AU - Maneuski, Dzmitry

AU - O'Shea, Val

AU - Winkelmann, Aimo

N1 - 5 pages, 4 figures

PY - 2016/7/17

Y1 - 2016/7/17

N2 - We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.

AB - We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions.

KW - instrumentation

KW - pixel detector

KW - crystalline sensor materials

UR - https://arxiv.org/abs/1607.05269

M3 - Working paper

BT - Diffractive triangulation of radiative point sources

CY - Ithaca, NY

ER -

Vespucci S, Trager-Cowan C, Maneuski D, O'Shea V, Winkelmann A. Diffractive triangulation of radiative point sources. Ithaca, NY. 2016 Jul 17.