Diffraction grating characterisation for cold-atom experiments

J. P. McGilligan; P. F. Griffin; E. Riis; A. S. Arnold

doi:10.1364/JOSAB.33.001271

Diffraction grating characterisation for cold-atom experiments

J. P. McGilligan, P. F. Griffin, E. Riis, A. S. Arnold

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Abstract

We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.

Original language	English
Pages (from-to)	1271-1277
Number of pages	7
Journal	Journal of the Optical Society of America B
Volume	33
Issue number	6
Early online date	3 May 2016
DOIs	https://doi.org/10.1364/JOSAB.33.001271
Publication status	Published - 25 May 2016

Keywords

physics.atom-ph
physics.optics

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10.1364/JOSAB.33.001271

McGilligan-etal-JOSAB-2016-Diffraction-grating-characterisation-for-cold-atomAccepted author manuscript, 2.9 MB

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title = "Diffraction grating characterisation for cold-atom experiments",

abstract = "We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.",

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note = "{\textcopyright} 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.",

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AU - McGilligan, J. P.

AU - Griffin, P. F.

AU - Riis, E.

AU - Arnold, A. S.

N1 - © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.

PY - 2016/5/25

Y1 - 2016/5/25

N2 - We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.

AB - We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.

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KW - physics.optics

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DO - 10.1364/JOSAB.33.001271

M3 - Article

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EP - 1277

JO - Journal of the Optical Society of America B

JF - Journal of the Optical Society of America B

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ER -

Diffraction grating characterisation for cold-atom experiments

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