Diffraction grating characterisation for cold-atom experiments

J. P. McGilligan, P. F. Griffin, E. Riis, A. S. Arnold

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Abstract

We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.
Original languageEnglish
Pages (from-to)1271-1277
Number of pages7
JournalJournal of the Optical Society of America B
Volume33
Issue number6
Early online date3 May 2016
DOIs
Publication statusPublished - 25 May 2016

Keywords

  • physics.atom-ph
  • physics.optics

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