Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications

A. Winkelmann, G. Nolze, S. Vespucci, N. Gunasekar, C. Trager-Cowan, A. Vilalta-Clemente, A. J. Wilkinson, M. Vos

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

232 Downloads (Pure)

3 results

Finished
Novel applications of direct electron imaging in the scanning electron microscope
Trager-Cowan, C. (Principal Investigator)
Carnegie Trust for the Universities of Scotland
1/09/16 → 31/10/16
Project: Research
Manufacturing of nano-engineered III-nitride semiconductors
Martin, R. (Principal Investigator) & Trager-Cowan, C. (Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/05/15 → 30/09/21
Project: Research
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.
Trager-Cowan, C. (Principal Investigator), Gray, A. (Co-investigator) & Hourahine, B. (Co-investigator)
EPSRC (Engineering and Physical Sciences Research Council)
1/07/12 → 30/06/16
Project: Research