Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection

A. Hurtado, I.D. Henning, M.J. Adams

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

1 Citation (Scopus)

Abstract

We report the experimental observation of differences in the injection locking bandwidth of a 1550nm-VCSEL subject to optical injection with different input polarization angles into the two polarizations of the fundamental mode of the device.

LanguageEnglish
Title of host publication21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008
Place of PublicationPiscataway, NJ.
PublisherIEEE
Pages322-323
Number of pages2
ISBN (Print)9781424419319
DOIs
Publication statusPublished - 3 Mar 2009
Event21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2008 - Newport Beach, CA, United States
Duration: 9 Nov 200813 Nov 2008

Conference

Conference21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2008
CountryUnited States
CityNewport Beach, CA
Period9/11/0813/11/08

Fingerprint

Surface emitting lasers
Polarization
Bandwidth

Keywords

  • polarization
  • telecommunication systems
  • 1550 nm
  • experimental observations
  • fundamental modes
  • injection locking
  • input polarizations
  • optical injections
  • surface emitting lasers

Cite this

Hurtado, A., Henning, I. D., & Adams, M. J. (2009). Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection. In 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008 (pp. 322-323). [4688620] Piscataway, NJ.: IEEE. https://doi.org/10.1109/LEOS.2008.4688620
Hurtado, A. ; Henning, I.D. ; Adams, M.J. / Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection. 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. Piscataway, NJ. : IEEE, 2009. pp. 322-323
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title = "Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection",
abstract = "We report the experimental observation of differences in the injection locking bandwidth of a 1550nm-VCSEL subject to optical injection with different input polarization angles into the two polarizations of the fundamental mode of the device.",
keywords = "polarization, telecommunication systems, 1550 nm, experimental observations, fundamental modes, injection locking, input polarizations, optical injections, surface emitting lasers",
author = "A. Hurtado and I.D. Henning and M.J. Adams",
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Hurtado, A, Henning, ID & Adams, MJ 2009, Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection. in 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008., 4688620, IEEE, Piscataway, NJ., pp. 322-323, 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, LEOS 2008, Newport Beach, CA, United States, 9/11/08. https://doi.org/10.1109/LEOS.2008.4688620

Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection. / Hurtado, A.; Henning, I.D.; Adams, M.J.

21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. Piscataway, NJ. : IEEE, 2009. p. 322-323 4688620.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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AB - We report the experimental observation of differences in the injection locking bandwidth of a 1550nm-VCSEL subject to optical injection with different input polarization angles into the two polarizations of the fundamental mode of the device.

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KW - experimental observations

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KW - input polarizations

KW - optical injections

KW - surface emitting lasers

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Hurtado A, Henning ID, Adams MJ. Differences in the injection locking bandwidth in a 1550nm-VCSEL subject to distinct polarized optical injection. In 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. Piscataway, NJ.: IEEE. 2009. p. 322-323. 4688620 https://doi.org/10.1109/LEOS.2008.4688620