Developments in dielectric techniques for non-destructive examination

W.M. Banks, D. Hayward, R.A. Pethrick, G.S. Armstrong, R.L. Crane

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

Paper on the development in dielectric techniques for non-destructive examination.

Original language	English
Title of host publication	Proceedings of the 25th Annual Meeting of The Adhesion Society
Place of Publication	Florida, USA
Publication status	Published - 2002

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title = "Developments in dielectric techniques for non-destructive examination",

abstract = "Paper on the development in dielectric techniques for non-destructive examination.",

keywords = "dielectrics, mechanical engineering, adhesion",

author = "W.M. Banks and D. Hayward and R.A. Pethrick and G.S. Armstrong and R.L. Crane",

year = "2002",

language = "English",

isbn = "1086-9506",

booktitle = "Proceedings of the 25th Annual Meeting of The Adhesion Society",

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TY - CHAP

T1 - Developments in dielectric techniques for non-destructive examination

AU - Banks, W.M.

AU - Hayward, D.

AU - Pethrick, R.A.

AU - Armstrong, G.S.

AU - Crane, R.L.

PY - 2002

Y1 - 2002

N2 - Paper on the development in dielectric techniques for non-destructive examination.

AB - Paper on the development in dielectric techniques for non-destructive examination.

KW - dielectrics

KW - mechanical engineering

KW - adhesion

UR - http://www.adhesionsociety.org/

M3 - Chapter

SN - 1086-9506

BT - Proceedings of the 25th Annual Meeting of The Adhesion Society

CY - Florida, USA

ER -