Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments

James Bain, Michael Lengden, Ian Armstrong, George Stewart, Walter Johnstone

Research output: Contribution to conferenceSpeech

Abstract

A summary is given of recent developments in tunable diode laser spectroscopy instrumentation for harsh environments. Application areas highlighted include solid oxide fuel cell monitoring and aero engine ground testing including spatially-resolved measurements

Conference

ConferenceApplied Industrial Optics: Spectroscopy, Imaging, and Metrology
CountryUnited States
CityArlington
Period23/06/1327/06/13

Fingerprint

Laser spectroscopy
Solid oxide fuel cells (SOFC)
Semiconductor lasers
Engines
Monitoring
Testing
Gases

Keywords

  • spectroscopy instrumentation
  • tunable diode laser
  • gas species measurements
  • harsh environments

Cite this

Bain, J., Lengden, M., Armstrong, I., Stewart, G., & Johnstone, W. (2013). Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments. Applied Industrial Optics: Spectroscopy, Imaging, and Metrology , Arlington, United States.
Bain, James ; Lengden, Michael ; Armstrong, Ian ; Stewart, George ; Johnstone, Walter. / Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments. Applied Industrial Optics: Spectroscopy, Imaging, and Metrology , Arlington, United States.
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abstract = "A summary is given of recent developments in tunable diode laser spectroscopy instrumentation for harsh environments. Application areas highlighted include solid oxide fuel cell monitoring and aero engine ground testing including spatially-resolved measurements",
keywords = "spectroscopy instrumentation, tunable diode laser, gas species measurements, harsh environments",
author = "James Bain and Michael Lengden and Ian Armstrong and George Stewart and Walter Johnstone",
year = "2013",
month = "6",
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language = "English",
note = "Applied Industrial Optics: Spectroscopy, Imaging, and Metrology ; Conference date: 23-06-2013 Through 27-06-2013",

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Bain, J, Lengden, M, Armstrong, I, Stewart, G & Johnstone, W 2013, 'Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments' Applied Industrial Optics: Spectroscopy, Imaging, and Metrology , Arlington, United States, 23/06/13 - 27/06/13, .

Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments. / Bain, James; Lengden, Michael; Armstrong, Ian; Stewart, George; Johnstone, Walter.

2013. Applied Industrial Optics: Spectroscopy, Imaging, and Metrology , Arlington, United States.

Research output: Contribution to conferenceSpeech

TY - CONF

T1 - Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments

AU - Bain, James

AU - Lengden, Michael

AU - Armstrong, Ian

AU - Stewart, George

AU - Johnstone, Walter

PY - 2013/6/23

Y1 - 2013/6/23

N2 - A summary is given of recent developments in tunable diode laser spectroscopy instrumentation for harsh environments. Application areas highlighted include solid oxide fuel cell monitoring and aero engine ground testing including spatially-resolved measurements

AB - A summary is given of recent developments in tunable diode laser spectroscopy instrumentation for harsh environments. Application areas highlighted include solid oxide fuel cell monitoring and aero engine ground testing including spatially-resolved measurements

KW - spectroscopy instrumentation

KW - tunable diode laser

KW - gas species measurements

KW - harsh environments

UR - http://www.osa.org/osaorg/media/osa.media/Meetings/PDFSupportingDoc/2013/2013_Imaging_Congress_FINAL_Program.pdf

M3 - Speech

ER -

Bain J, Lengden M, Armstrong I, Stewart G, Johnstone W. Development of tunable diode laser spectroscopy instrumentation for gas species measurements in harsh environments. 2013. Applied Industrial Optics: Spectroscopy, Imaging, and Metrology , Arlington, United States.