Determining the temperature-dependent London penetration depth in HTS thin films and its effect on SQUID performance

Shane Keenan, Colin Pegrum, Marc Gali Labarias, Emma E. Mitchell

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)
12 Downloads (Pure)

Abstract

The optimum design of high-sensitivity Superconducting Quantum Interference Devices (SQUIDs) and other devices based on thin high-temperature superconductor (HTS) films requires accurate inductance modeling. This needs the London penetration depth λ to be well defined, not only at 77K, but also for any operating temperature, given the increasingly widespread use of miniature low-noise single-stage cryocoolers. Temperature significantly affects all inductances in any active superconducting device, and cooling below 77 K can greatly improve device performance; however, accurate data for the temperature dependence of inductance and λT for HTS devices are largely missing in the literature. We report here inductance measurements on a set of 20 different thin-film YBa 2Cu 3O 7−x SQUIDs at 77K with thickness t=220 or 113nm. By combining experimental data and inductance modeling, we find an average penetration depth λ 77=nm at 77K, which was independent of t. Using the same methods, we derive an empirical expression for λ for a further three SQUIDs measured on a cryocooler from 50 to 79=K. Our measured value of λ7 and our inductance extraction procedures were then used to estimate the inductances and the effective areas of directly coupled SQUID magnetometers with large washer-style pickup loops. The latter agrees better than 7% with experimentally measured values, validating our measured value of λ and our inductance extraction methods.

Original languageEnglish
Article number142601
Number of pages6
JournalApplied Physics Letters
Volume119
Issue number14
DOIs
Publication statusPublished - 4 Oct 2021

Keywords

  • Superconducting Quantum Interference Devices (SQUIDs)
  • HTS thin films
  • high temperature superconductor (HTS)

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