Determining the dimensionality of bipartite orbital-angular-momentum entanglement using multi-sector phase masks

D. Giovannini, F. M. Miatto, J. Romero, S. M. Barnett, J. P. Woerdman, M. J. Padgett

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Abstract

The Shannon dimensionality of orbital-angular-momentum (OAM) entanglement produced in spontaneous parametric down-conversion can be probed by using multi-sector phase analysers [1]. We demonstrate a spatial light modulator-based implementation of these analysers, and use it to measure a Schmidt number of about 50.

Original languageEnglish
Article number073046
Number of pages9
JournalNew Journal of Physics
Volume14
Issue number7
DOIs
Publication statusPublished - 24 Jul 2012

Keywords

  • entangled photons
  • optical processors
  • multi-sector phase analysers

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