Detection of recrystallized structure by means of automatic analysis of electron backscattered diffraction patterns

T. N. Konkova, S. Yu. Mironov, A. V. Korznikov, M. M. Myshlyaev

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The possibility of applying the automatic analysis of electron backscattered diffraction (EBSD) patterns to reveal the recrystallized structure in the partially recrystallized material has been discussed. The analysis has been performed based on new experimental results. It has been shown that the EBSD method can be successfully used to investigate the recrystallization process.
Original languageEnglish
Pages (from-to)694-698
Number of pages5
JournalPhysics of the Solid State
Volume54
Issue number4
DOIs
Publication statusPublished - 18 Apr 2012

Keywords

  • solid state physics
  • electron backscattered diffraction
  • recrystallization

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