Degradation mode and criticality analysis based on product usage data

Jong Ho Shin, Hong Bae Jun, Cedric Catteneo, Dimitris KIritsis, Paul Xirouchakis

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Degradation mode and criticality analysis based on product usage data'. Together they form a unique fingerprint.

Engineering

Computer Science

Material Science