Defect location and characterisation in an EPR MV cable using TDOA and thermal techniques
Alistair James Reid, Xiao Hu, Martin Judd, Wah Hoon Siew
Research output: Contribution to conference › Paper › peer-review
Alistair James Reid, Xiao Hu, Martin Judd, Wah Hoon Siew
Research output: Contribution to conference › Paper › peer-review