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Accurate characterization of incident radiation is a fundamental challenge for diagnostic design. Herein, we present an efficient spectral analysis routine that is able to characterize multiple components within the spectral emission by analytically reducing the number of parameters. The technique is presented alongside the design of a hard x-ray linear absorption spectrometer using the example of multiple Boltzmann-like spectral distributions; however, it is generally applicable to all absorption based spectrometer designs and can be adapted to any incident spectral shape. This routine is demonstrated to be tolerable to experimental noise and suitable for real-time data processing at multi-Hz repetition rates.
- high intensity laser interactions
- X-ray emission
- accelerated electrons
FingerprintDive into the research topics of 'Deconvolution of multi-Boltzmann x-ray distribution from linear absorption spectrometer via analytical parameter reduction'. Together they form a unique fingerprint.
- 1 Active
1/11/17 → 31/10/22