DC fault parameter sensitivity analysis

Frederick Page, Grain Adam, Stephen Finney, Derrick Holliday, Lie Xu

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

2 Citations (Scopus)

Abstract

At present High Voltage Direct Current (HVDC) Voltage Source Converters (VSC) are susceptible dc faults leading to extreme currents. The fault current cannot be controlled by the converter switching flows in the anti-parallel diodes. Protection devices are, therefore, required to operate with sufficient speed to avoid device failure. A method is introduced to calculate the critical time for protection to operate. Using this method it is then shown how the critical time may be extended by way of optimization of passive system components. In order to perform this optimization a new post-fault (when the converter gating signals are inhibited) model of the Modular Multi-Level (MMC) converter is introduced which drastically reduces simulation time, allowing high resolution parameter sweeps to be performed. The model is validated and is shown to produce fault characteristics similar to that of a conventional switched model.

LanguageEnglish
Title of host publicationProceedings of the 12th IET International Conference on Developments in Power System Protection (DPSP 2014)
Place of PublicationStevenage, UK
Number of pages6
Volume2014
DOIs
Publication statusPublished - 2014
Event12th IET International Conference on Developments in Power System Protection, DPSP 2014 - Copenhagen, United Kingdom
Duration: 31 Mar 20143 Apr 2014

Conference

Conference12th IET International Conference on Developments in Power System Protection, DPSP 2014
CountryUnited Kingdom
CityCopenhagen
Period31/03/143/04/14

Fingerprint

Sensitivity analysis
Electric fault currents
Electric potential
Diodes

Keywords

  • DC faults
  • high voltage direct current transmission
  • modular multi-level modeling
  • voltage source converters
  • power system protection
  • optimisation techniques
  • DC transmission

Cite this

Page, F., Adam, G., Finney, S., Holliday, D., & Xu, L. (2014). DC fault parameter sensitivity analysis. In Proceedings of the 12th IET International Conference on Developments in Power System Protection (DPSP 2014) (Vol. 2014). [3.1.4] Stevenage, UK. https://doi.org/10.1049/cp.2014.0014
Page, Frederick ; Adam, Grain ; Finney, Stephen ; Holliday, Derrick ; Xu, Lie. / DC fault parameter sensitivity analysis. Proceedings of the 12th IET International Conference on Developments in Power System Protection (DPSP 2014). Vol. 2014 Stevenage, UK, 2014.
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title = "DC fault parameter sensitivity analysis",
abstract = "At present High Voltage Direct Current (HVDC) Voltage Source Converters (VSC) are susceptible dc faults leading to extreme currents. The fault current cannot be controlled by the converter switching flows in the anti-parallel diodes. Protection devices are, therefore, required to operate with sufficient speed to avoid device failure. A method is introduced to calculate the critical time for protection to operate. Using this method it is then shown how the critical time may be extended by way of optimization of passive system components. In order to perform this optimization a new post-fault (when the converter gating signals are inhibited) model of the Modular Multi-Level (MMC) converter is introduced which drastically reduces simulation time, allowing high resolution parameter sweeps to be performed. The model is validated and is shown to produce fault characteristics similar to that of a conventional switched model.",
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Page, F, Adam, G, Finney, S, Holliday, D & Xu, L 2014, DC fault parameter sensitivity analysis. in Proceedings of the 12th IET International Conference on Developments in Power System Protection (DPSP 2014). vol. 2014, 3.1.4, Stevenage, UK, 12th IET International Conference on Developments in Power System Protection, DPSP 2014, Copenhagen, United Kingdom, 31/03/14. https://doi.org/10.1049/cp.2014.0014

DC fault parameter sensitivity analysis. / Page, Frederick; Adam, Grain; Finney, Stephen; Holliday, Derrick; Xu, Lie.

Proceedings of the 12th IET International Conference on Developments in Power System Protection (DPSP 2014). Vol. 2014 Stevenage, UK, 2014. 3.1.4.

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

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Page F, Adam G, Finney S, Holliday D, Xu L. DC fault parameter sensitivity analysis. In Proceedings of the 12th IET International Conference on Developments in Power System Protection (DPSP 2014). Vol. 2014. Stevenage, UK. 2014. 3.1.4 https://doi.org/10.1049/cp.2014.0014