Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns

Gert Nolze, Tomasz Tokarski, Łukasz Rychłowski, Grzegorz Cios, Aimo Winkelmann

Research output: Contribution to journalArticlepeer-review

Abstract

A new software is presented for the determination of crystal lattice parameters from the positions and widths of Kikuchi bands in a diffraction pattern. Starting with a single wide-angle Kikuchi pattern of arbitrary resolution and unknown phase, the traces of all visibly diffracting lattice planes are manually derived from four initial Kikuchi band traces via an intuitive graphical user interface. A single Kikuchi bandwidth is then used as reference to scale all reciprocal lattice point distances. Kikuchi band detection, via a filtered Funk transformation, and simultaneous display of the band intensity profile helps users to select band positions and widths. Bandwidths are calculated using the first derivative of the band profiles as excess-deficiency effects have minimal influence. From the reciprocal lattice, the metrics of possible Bravais lattice types are derived for all crystal systems. The measured lattice parameters achieve a precision of
Original languageEnglish
Pages (from-to)1012-1022
Number of pages11
JournalJournal of Applied Crystallography
Volume54
Issue number3
Early online date28 May 2021
DOIs
Publication statusPublished - 1 Jun 2021

Keywords

  • Kikuchi patterns
  • Radon transform
  • electron backscatter diffraction
  • lattice parameters

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