Abstract
The charge collection efficiency (CCE) of silicon detectors, previously irradiated with high neutron fluences, has been measured at 4.2, 77 and 195 K. The CCE recovery measured after 1.2x10^14 n/cm2 is 100% at a bias voltage of 50 V. For 2x10^15 n/cm2 the most probable signal collected for minimum ionising particles is 13 000 electrons, corresponding to 50% CCE, at a bias voltage of 250 V. Negligible difference has been observed between 77 and 4.2 K operation, while no recovery was measurable at 195 K. The timing of the signal was measured to be better than 5 ns. The samples were irradiated and stored at room temperature and cooled only when operated. Reproducible results were obtained after several weeks and several thermal cycles.
Original language | English |
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Pages (from-to) | 114-117 |
Number of pages | 4 |
Journal | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 434 |
Issue number | 1 |
DOIs | |
Publication status | Published - 11 Sept 1999 |
Keywords
- silicon detectors
- CCE
- cryogenic temperatures