Corrigendum: Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)

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Abstract

In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.
Original languageEnglish
Article number079501
Number of pages1
JournalSemiconductor Science and Technology
Volume33
Early online date21 May 2018
DOIs
Publication statusPublished - 6 Jun 2018

Keywords

  • cathodoluminescence
  • semiconductors

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