Corrigendum: Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)

Research output: Contribution to journalComment/debate

Abstract

In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.
LanguageEnglish
Article number079501
Number of pages1
JournalSemiconductor Science and Technology
Volume33
Early online date21 May 2018
DOIs
Publication statusPublished - 6 Jun 2018

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Spectrographs
Cathodoluminescence
cathodoluminescence
Luminescence
Cones
Semiconductor materials
half cones
tangents
spectrographs
field of view
slits
luminescence
approximation
corrigendum

Keywords

  • cathodoluminescence
  • semiconductors

Cite this

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title = "Corrigendum: Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)",
abstract = "In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.",
keywords = "cathodoluminescence, semiconductors",
author = "Edwards, {Paul R} and Martin, {Robert W}",
note = "This corrigendum to the 2011 article https://doi.org/10.1088/0268-1242/26/6/064005",
year = "2018",
month = "6",
day = "6",
doi = "10.1088/1361-6641/aac678",
language = "English",
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journal = "Semiconductor Science and Technology",
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T1 - Corrigendum

T2 - Semiconductor Science and Technology

AU - Edwards, Paul R

AU - Martin, Robert W

N1 - This corrigendum to the 2011 article https://doi.org/10.1088/0268-1242/26/6/064005

PY - 2018/6/6

Y1 - 2018/6/6

N2 - In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.

AB - In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.

KW - cathodoluminescence

KW - semiconductors

UR - https://strathprints.strath.ac.uk/30546/

U2 - 10.1088/1361-6641/aac678

DO - 10.1088/1361-6641/aac678

M3 - Comment/debate

VL - 33

JO - Semiconductor Science and Technology

JF - Semiconductor Science and Technology

SN - 0268-1242

M1 - 079501

ER -