Corrigendum: Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)

Research output: Contribution to journalComment/debate

Abstract

In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.
LanguageEnglish
Article number079501
Number of pages1
JournalSemiconductor Science and Technology
Volume33
Early online date21 May 2018
DOIs
StatePublished - 6 Jun 2018

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Spectrographs
Cathodoluminescence
cathodoluminescence
Luminescence
Cones
Semiconductor materials
half cones
tangents
spectrographs
field of view
slits
luminescence
approximation
corrigendum

Keywords

  • cathodoluminescence
  • semiconductors

Cite this

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title = "Corrigendum: Cathodoluminescence nano-characterization of semiconductors (2011 Semicond. Sci. Technol. 26 064005)",
abstract = "In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.",
keywords = "cathodoluminescence, semiconductors",
author = "Edwards, {Paul R} and Martin, {Robert W}",
note = "This corrigendum to the 2011 article https://doi.org/10.1088/0268-1242/26/6/064005",
year = "2018",
month = "6",
day = "6",
doi = "10.1088/1361-6641/aac678",
language = "English",
volume = "33",
journal = "Semiconductor Science and Technology",
issn = "0268-1242",

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T1 - Corrigendum

T2 - Semiconductor Science and Technology

AU - Edwards,Paul R

AU - Martin,Robert W

N1 - This corrigendum to the 2011 article https://doi.org/10.1088/0268-1242/26/6/064005

PY - 2018/6/6

Y1 - 2018/6/6

N2 - In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.

AB - In our original paper, we estimated the maximum field of view (FOV) that would result when collecting luminescence over a cone half-angle u and coupling this into a spectrograph with a given f /number and a slit width d. Due to the use of the low-angle approximation outwith the paraxial regime, the expression given in Equation 2 used the tangent of the angle rather than the correct sine function.

KW - cathodoluminescence

KW - semiconductors

UR - https://strathprints.strath.ac.uk/30546/

U2 - 10.1088/1361-6641/aac678

DO - 10.1088/1361-6641/aac678

M3 - Comment/debate

VL - 33

JO - Semiconductor Science and Technology

JF - Semiconductor Science and Technology

SN - 0268-1242

M1 - 079501

ER -