Correlation-length-based sampling conditions for various engineering surfaces

Anh Tuan Nguyen, David Lee Butler

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

Original languageEnglish
Pages (from-to)1813-1822
Number of pages10
JournalMeasurement Science and Technology
Volume16
Issue number9
DOIs
Publication statusPublished - 11 Aug 2005
Externally publishedYes

Keywords

  • correlation length
  • sampling condition
  • surface measurement

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