Correlation-length-based sampling conditions for various engineering surfaces

Anh Tuan Nguyen, David Lee Butler

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

LanguageEnglish
Pages1813-1822
Number of pages10
JournalMeasurement Science and Technology
Volume16
Issue number9
DOIs
Publication statusPublished - 11 Aug 2005
Externally publishedYes

Fingerprint

Correlation Length
sampling
engineering
Sampling
Engineering
Surface measurement
Spectrum analysis
Analytical models
Power Analysis
Spectral Analysis
Analytical Model
spectrum analysis
cut-off
Three-dimensional

Keywords

  • correlation length
  • sampling condition
  • surface measurement

Cite this

@article{2b2c13145ecc4920893bb86fde57c441,
title = "Correlation-length-based sampling conditions for various engineering surfaces",
abstract = "The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.",
keywords = "correlation length, sampling condition, surface measurement",
author = "Nguyen, {Anh Tuan} and Butler, {David Lee}",
year = "2005",
month = "8",
day = "11",
doi = "10.1088/0957-0233/16/9/014",
language = "English",
volume = "16",
pages = "1813--1822",
journal = "Measurement Science and Technology",
issn = "0957-0233",
number = "9",

}

Correlation-length-based sampling conditions for various engineering surfaces. / Nguyen, Anh Tuan; Butler, David Lee.

In: Measurement Science and Technology, Vol. 16, No. 9, 11.08.2005, p. 1813-1822.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Correlation-length-based sampling conditions for various engineering surfaces

AU - Nguyen, Anh Tuan

AU - Butler, David Lee

PY - 2005/8/11

Y1 - 2005/8/11

N2 - The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

AB - The paper proposes the criteria for selecting the sampling condition in three-dimensional surface measurement. The criteria are based on the fact that there is a relationship between the correlation length of the measured surface and its high-frequency cut-off. Through the use of the sampled surfaces and the analytical models, it is shown that the criteria are equivalent to the power spectral analysis.

KW - correlation length

KW - sampling condition

KW - surface measurement

UR - http://www.scopus.com/inward/record.url?scp=24144473029&partnerID=8YFLogxK

UR - http://iopscience.iop.org/journal/0957-0233

U2 - 10.1088/0957-0233/16/9/014

DO - 10.1088/0957-0233/16/9/014

M3 - Article

VL - 16

SP - 1813

EP - 1822

JO - Measurement Science and Technology

T2 - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 9

ER -