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Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors
Isa Hatipoglu, Daniel A. Hunter, Partha Mukhopadhyay, Martin S. Williams, Paul R. Edwards, Robert W. Martin, Winston V. Schoenfeld, G. Naresh Gunasekar
Research output: Contribution to journal › Article › peer-review
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