Correlation between deep-level defects and functional properties of β-(SnxGa1-x)2O3 on Si photodetectors

Isa Hatipoglu, Daniel A. Hunter, Partha Mukhopadhyay, Martin S. Williams, Paul R. Edwards, Robert W. Martin, Winston V. Schoenfeld, G. Naresh Gunasekar

Research output: Contribution to journalArticlepeer-review

Abstract

Heterogeneous integration of β-(SnxGa1-x)2O3 (TGO) UV-C photodetectors on silicon substrates by molecular beam epitaxy is demonstrated. Multimodal electron microscopy and spectroscopy techniques reveal a direct correlation between structural, compositional and optical properties of the TGO and the functional properties of the photodetectors. Wavelength dispersive X-ray spectroscopy results accurately determine the Sn concentrations (x) in the region of 0.020, and room temperature cathodoluminescence (CL) hyperspectral imaging shows changes in CL emission intensity in the TGO compared with a Ga2O3 sample with no Sn. Alloying Ga2O3 with Sn is shown to quench the red emission and enhance the blue emission. The increase in blue emission corresponds to the rise in VGa-related deep acceptors responsible for the high gain observed in the TGO detectors. A Ga2O3 nucleation layer is shown to improve the TGO surface quality and give better device properties compared to TGO grown directly onto the Si substrate, including a higher specific detectivity on the order of 1012 Jones.
Original languageEnglish
Number of pages20
JournalJournal of Applied Physics
Publication statusAccepted/In press - 4 Nov 2021

Keywords

  • gallium oxide
  • cathodoluminescence hyperspectral imaging
  • XRD analysis
  • thin films
  • photodetector

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