Contact effects in Gunn diodes

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)


This letter shows how the splitting of the forward and reverse current/voltage curves of a Gunn diode may be interpreted in terms of different models of contact damage, and proposes a simple test technique to obtain a quantitative measure of contact quality. Experimental verification of this technique is presented, showing a correlation between device efficiency and a contact parameter ß.
Original languageEnglish
Pages (from-to)711-713
Number of pages3
JournalElectronics Letters
Issue number24
Publication statusPublished - 2 Dec 1971


  • Gunn diodes
  • electrical contacts
  • semiconductor device testing
  • quantitative measure of contact quality


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