Confocal laser scanning microscopy using a frequency doubled vertical external cavity surface emitting laser

E. Esposito, Stefanie Keatings, Kyle Gardner, J. Harris, E. Riis, G. McConnell

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We report on a frequency doubled 980 nm vertical external cavity surface emitting laser for applications in confocal laser scanning microscopy. The beam quality, wavelength flexibility, and low noise characteristics of this compact source make this prolific imaging technique an exemplary tool. Single pass frequency doubling via KNbO3 was demonstrated, yielding 1.8 mW at 490 nm with a near diffraction limited beam quality. Detailed analysis and comparison of the laser performance with the current standard argon ion laser revealed clear advantages of the solid-state source for confocal imaging. Imaging of fluorescein and eGFP labeled biological samples using the attenuated solid-state source provided high-resolution images at lower cost and with improved reliability. ©2008 American Institute of Physics
LanguageEnglish
JournalReview of Scientific Instruments
Volume79
Issue number8
DOIs
Publication statusPublished - 5 Aug 2008

Fingerprint

Surface emitting lasers
surface emitting lasers
Microscopic examination
Beam quality
microscopy
Scanning
Imaging techniques
cavities
scanning
Lasers
solid state
lasers
Image resolution
imaging techniques
low noise
Argon
flexibility
Diffraction
argon
Wavelength

Keywords

  • niobium compounds
  • optical microscopy
  • potassium compounds
  • surface emitting lasers

Cite this

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abstract = "We report on a frequency doubled 980 nm vertical external cavity surface emitting laser for applications in confocal laser scanning microscopy. The beam quality, wavelength flexibility, and low noise characteristics of this compact source make this prolific imaging technique an exemplary tool. Single pass frequency doubling via KNbO3 was demonstrated, yielding 1.8 mW at 490 nm with a near diffraction limited beam quality. Detailed analysis and comparison of the laser performance with the current standard argon ion laser revealed clear advantages of the solid-state source for confocal imaging. Imaging of fluorescein and eGFP labeled biological samples using the attenuated solid-state source provided high-resolution images at lower cost and with improved reliability. {\circledC}2008 American Institute of Physics",
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Confocal laser scanning microscopy using a frequency doubled vertical external cavity surface emitting laser. / Esposito, E.; Keatings, Stefanie; Gardner, Kyle; Harris, J.; Riis, E.; McConnell, G.

In: Review of Scientific Instruments, Vol. 79, No. 8, 05.08.2008.

Research output: Contribution to journalArticle

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AU - Riis, E.

AU - McConnell, G.

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