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Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays

  • Silvia Cipiccia
  • , Mark Wiggins
  • , Dzmitry Maneuski
  • , Enrico Brunetti
  • , Gregory Vieux
  • , Xue Yang
  • , Riju Issac
  • , Gregor H. Welsh
  • , Maria Pia Anania
  • , Mohammad Islam
  • , Bernhard Ersfeld
  • , Rachel Montgomery
  • , Gary Smith
  • , Matthias Hoek
  • , David J. Hamilton
  • , Nuno R. C. Lemos
  • , Dan Symes
  • , Pattathil P. Rajeev
  • , V. O'Shea
  • , João M. Dias
  • Dino Jaroszynski

Research output: Contribution to journalArticlepeer-review

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Abstract

Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmium telluride detector has been used to measure spectra of Compton side-scattered radiation from a Cobalt-60 laboratory source and a high flux, high peak brilliance X-ray source of betatron radiation from a laser-plasma wakefield accelerator.
Original languageEnglish
Article number113302
JournalReview of Scientific Instruments
Volume84
Issue number11
Early online date5 Nov 2013
DOIs
Publication statusPublished - 2013

Keywords

  • compton scattering
  • spectroscopic detection
  • ultra-fast
  • high flux
  • broad energy range X-rays

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