Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays

Silvia Cipiccia, Mark Wiggins, Dzmitry Maneuski, Enrico Brunetti, Gregory Vieux, Xue Yang, Riju Issac, Gregor H. Welsh, Maria Pia Anania, Mohammad Islam, Bernhard Ersfeld, Rachel Montgomery, Gary Smith, Matthias Hoek, David J. Hamilton, Nuno R. C. Lemos, Dan Symes, Pattathil P. Rajeev, V. O'Shea, João M. DiasDino Jaroszynski

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)
227 Downloads (Pure)

Abstract

Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmium telluride detector has been used to measure spectra of Compton side-scattered radiation from a Cobalt-60 laboratory source and a high flux, high peak brilliance X-ray source of betatron radiation from a laser-plasma wakefield accelerator.
Original languageEnglish
Article number113302
JournalReview of Scientific Instruments
Volume84
Issue number11
Early online date5 Nov 2013
DOIs
Publication statusPublished - 2013

Keywords

  • compton scattering
  • spectroscopic detection
  • ultra-fast
  • high flux
  • broad energy range X-rays

Fingerprint

Dive into the research topics of 'Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays'. Together they form a unique fingerprint.

Cite this