Comparing SiC MOSFET, IGBT and Si MOSFET in LV distribution inverters

N.M. Roscoe, Y. Zhong, S.J. Finney

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

6 Citations (Scopus)
136 Downloads (Pure)

Abstract

Efficency, power quality and EMI are three crucial performance drivers in LVDC applications such as electrical supply, EV charging or DC aerospace. Recent developments in SiC MOSFETs and MMC for LVDC promise two significant improvements in LVDC inverter performance. However, the designer is left with many combinations of technology and inverter level to choose from. This paper aims to clarify this choice by identifying one optimum Si design and one optimum SiC design, using detailed loss calculations. An IGBT inverter is included as a baseline. Loss calculations estimate the effects of Si MOSFET switching loss and all parasitic interconnection loss. The validity of the loss estimations are verified using careful experiments on a Si MOSFET cell. Close agreement indicates that the modelling approach is valid for extension to many cells in series, and to the parallel connection of many devices. Despite the lower EMI inherent in MMC inverters, Si MOSFETs risk worse EMI, due to poor reverse recovery characteristic. Slowed device gate switching experimentally demonstrates the reduction in switching noise, promising very low EMI. This initial study has therefore identified two promising candidate SiC and Si MOSFET inverters which will be fully constructed in future work, in order to aid designers in choosing the optimum semiconductor technology and topology for LVDC inverters.
Original languageEnglish
Title of host publication41st Annual Conference of the IEEE Industrial Electronics Society
Place of PublicationPiscataway, NJ.
PublisherIEEE
Number of pages6
ISBN (Print)9781479917624
DOIs
Publication statusAccepted/In press - 31 Jul 2015
Event41st Annual Conference of the IEEE Industrial Electronics Society - Pacifico Yokohama, Yokohama, Japan
Duration: 9 Nov 201512 Nov 2015

Conference

Conference41st Annual Conference of the IEEE Industrial Electronics Society
CountryJapan
CityYokohama
Period9/11/1512/11/15

Keywords

  • Si MOSFET
  • MMC
  • SiC MOSFET
  • loss calculation
  • EMI
  • EMC
  • ringing
  • voltage overshoot
  • diode reverse recovery
  • power quality

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    Roscoe, N. M., Zhong, Y., & Finney, S. J. (Accepted/In press). Comparing SiC MOSFET, IGBT and Si MOSFET in LV distribution inverters. In 41st Annual Conference of the IEEE Industrial Electronics Society [7392188] Piscataway, NJ.: IEEE. https://doi.org/10.1109/IECON.2015.7392188