Lengden, M., Stewart, G.,
Johnstone, W., Upadhyay, A., Wilson, D., Polydorides , N., McCann, H., Liu, C., Enemali, G., Tsekenis, S.-A., Wright, P., Kliment, J., Archilla, V., Velasco, J., Valdepenas, J.-S., Beltran, M., Polo, V., Armstrong, I. & Mauchline, I.,
22 Jun 2020,
Applied Industrial Spectroscopy 2020. Washington, DC:
Optical Society of America, JM2F.3
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book