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Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process
C. Veerappan, J. Richardson, R. Walker, D. U. Li, M. W. Fishburn, D. Stoppa, F. Borghetti, Y. Maruyama, M. Gersbach, R. K. Henderson, C. Bruschini, E. Charbon
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution book
16
Citations
(Scopus)