Characterization of large-scale non-uniformities in a 20k TDC/SPAD array integrated in a 130nm CMOS process

C. Veerappan, J. Richardson, R. Walker, D. U. Li, M. W. Fishburn, D. Stoppa, F. Borghetti, Y. Maruyama, M. Gersbach, R. K. Henderson, C. Bruschini, E. Charbon

Research output: Chapter in Book/Report/Conference proceedingConference contribution book

15 Citations (Scopus)

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