Characterisation of periodically poled materials using nonlinear microscopy

J. Harris, G. Norris, G. McConnell

Research output: Contribution to journalArticle

11 Citations (Scopus)
223 Downloads (Pure)

Abstract

Periodically poled crystalline materials are extremely attractive for processes such as second harmonic generation and optical parametric generation due to their very high conversion efficiency. For optimal performance, fabrication of poled regions with sub-micron tolerance is required. In this paper we introduce multi-photon laser scanning luminescence microscopy as a powerful minimally-invasive measurement technique which provides information about internal device structure with high spatial resolution that cannot be easily obtained with existing methods. A comparative study of confocal and multi-photon imaging of periodically poled crystalline materials is also performed.
Original languageEnglish
Pages (from-to)5667-5672
Number of pages5
JournalOptics Express
Volume16
Issue number8
DOIs
Publication statusPublished - 14 Apr 2008

Fingerprint

microscopy
photons
harmonic generations
spatial resolution
luminescence
fabrication
scanning
high resolution
lasers

Keywords

  • image processing
  • periodically poled materials
  • nonlinear microscopy
  • multiphoton processes

Cite this

Harris, J. ; Norris, G. ; McConnell, G. / Characterisation of periodically poled materials using nonlinear microscopy. In: Optics Express. 2008 ; Vol. 16, No. 8. pp. 5667-5672.
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Characterisation of periodically poled materials using nonlinear microscopy. / Harris, J.; Norris, G.; McConnell, G.

In: Optics Express, Vol. 16, No. 8, 14.04.2008, p. 5667-5672.

Research output: Contribution to journalArticle

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