Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

V. Kachkanov, Igor Dobnya, Kevin O'Donnell, Katharina Lorenz, Sergio Manuel De Sousa Pereira, Ian Watson, Thomas Sadler, Haoning Li, Vitaly Zubialevich, Peter Parbrook

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3 Citations (Scopus)

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