Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping

V. Kachkanov, Igor Dobnya, Kevin O'Donnell, Katharina Lorenz, Sergio Manuel De Sousa Pereira, Ian Watson, Thomas Sadler, Haoning Li, Vitaly Zubialevich, Peter Parbrook

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction–space while probing III-nitride materials on the microscale.
Original languageEnglish
Pages (from-to)481-485
Number of pages5
JournalPhysica Status Solidi C
Issue number3
Early online date21 Dec 2012
Publication statusPublished - Mar 2013


  • X-ray microdiffraction
  • eciprocal space mapping
  • synchrotron radiation
  • nitride materials

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